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Date: 04 July 2008
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Profilometer, Atomic Force Microscope (AFM/SPM) and Interferometer Surface Measurement (Popularity: 1)

Category: ELECTRONICS \ Test & Measurement \ Surface Metrology Instrument

Ambios Technology supplies industrial and academic researchers with affordable, world-class surface metrology instruments. Founded in 1996, the company is well-known for its strong technical emphasis, rigorous attention to quality, and...

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