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Date: 22 November 2009
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Base Transit Time of a Bipolar Transistor with Gaussian Base Doping Profile  
Topic Name: Base Transit Time of a Bipolar Transistor with Gaussian Base Doping Profile
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Category: Electronics

Research persons: Touhidur Rahman, Md. Ziaur Rahman Khan , M. M. Shahidul Hassan

Location: Dhaka, Bangladesh

Details

Abstract :

 

In this work, an analytical expression for base transit time tb of a modern high-speed npn bipolar transistor with gaussian base profile is obtained. The doping dependence of mobility, bandgap narrowing effect and carrier velocity saturation at the base edge of the collector-base junction are incorporated in finding tb. The collector current density, Jn, and minority carrier stored charge per unit area, QnB, are separately expressed as a function of the injected electron density n(0) in the base in order to find tb. The modeling of Jn, QnB and tb is essential for the design of high-speed bipolar transistor. The base transit time calculated analytically is compared with numerical results in order to demonstrate the validity of the assumptions made in deriving the expression. The closed form expressions for collector current density and base transit time offer a physical insight into device operation and are a useful tool in device design and optimization.

 


Tags: Bipolar Transistor - Gaussian Base Doping Profile - base transit time - -
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