The Xi-100 is designed for the researcher who is interested in getting fast,
repeatable data from an instrument that is unencumbered by unnecessary levels of
complication. The Xi-100 uses phase-shifting interferometric technology combined
with an optical microscope to provide a non-contact 3D method of measuring the
roughness of surfaces.
Xi-100 Features Include:
Precise, high-resolution, non-contact 3D profiler
'Point and shoot' operation. The only instrument adjustments for
capturing measurements are sample position and focus, allowing for rapid and
easy imaging.
Accurate and repeatable data on smooth or rough surfaces
Measure smooth surfaces at the nanometer level - 0.2 nm (smooth mode)
Vertical Resolution
Full featured 3D analysis software comes standard with the Xi-100 and
operates with Windows®, Intel Processor and TFT Flat Panel Monitor.
Analysis package provides surface roughness, waviness, step height,
algorithms, and calculation tools
The Xi-100 can quickly and accurately measure smooth surfaces at the
nanometer level. Its design makes it easy to measure a variety of sample
types: opaque, transparent, smooth or rough with a non-contact
interferometric method (requires minimum sample reflectivity of 2% @ 550
nm).
Ambios Technology, Inc. was founded in 1996. The company is dedicated to the design and manufacture of innovative surface metrology instruments for the academic and general industrial sectors. With the number of installed instruments growing... more
