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Date: 04 July 2008
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Next Generation XP-Plus Surface Profilometer Product Line  
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Next Generation XP-Plus Surface Profilometer Product Line

Product Name: Next Generation XP-Plus Surface Profilometer Product Line

Product Description

Next Generation XP-Plus Surface Profilometer Product Line
These new instruments represent a substantial advancement in the state-of-the-art in surface profilometers. The new XP-Plus series is the culmination of nearly two years of research, product development, and field testing. Our customers' input was the impetus for the XP-Plus Series products, and is reflected in the features and performance of these next-generation products from Ambios. With this next generation product line, Ambios builds upon its industry reputation as the preferred provider of high resolution surface profilers.

Company Details

Ambios Technology, Inc. was founded in 1996. The company is dedicated to the design and manufacture of innovative surface metrology instruments for the academic and general industrial sectors. With the number of installed instruments growing... more

More Products of this Company: ACCESSORIES, OPTIONS, AND SUPPLIES, Q-Scope™ Series | Scanning Probe Microscope, Q-Scope™ Universal SPM | Scanning Probe Microscope, Xi-100 Non-Contact Optical Profiler | Scanning White Light Interferometer, XP-1 High Resolution Surface Profiler | Stylus-Type Profilometer, XP-2 High Resolution Surface Profiler | Stylus-Type Profilometer
Related Products: Q-Scope™ Universal SPM | Scanning Probe Microscope, Xi-100 Non-Contact Optical Profiler | Scanning White Light Interferometer, XP-1 High Resolution Surface Profiler | Stylus-Type Profilometer, XP-2 High Resolution Surface Profiler | Stylus-Type Profilometer
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