|
Product Name: XP-2 High Resolution Surface Profiler | Stylus-Type Profilometer
Product Description
When it comes to performance in a stylus profiler, nothing matches the Ambios
XP-2. Step height repeatability is guaranteed to be 10A or 0.1% of the nominal
value, whichever is greater. The user-programmable force control and linear-scan
stage technology represent a major advance in surface profiling technology. The
XP-2 features USB communications, making it compatible with most standard
networking environments.
XP-2 Features Include:
Linear-scan stage technology and precision optical flat (flat to 6 Angstroms per
millimeter) ensure the highest precision measurements. Step height repeatability
is guaranteed to be 10Å or 0.1% of nominal step, whichever is greater.
Sample translation is convenient with programmable motorized stage with 150mm x
178mm travel and manual 360º rotation. A 200mm vacuum chuck is standard.
Advancements in the control of the motorized stage enables users to
automatically move sample to up to 1,000 measurement locations and acquire data
with new Step Detection, Auto Level, and Auto Measure sequences to assist in
fast and efficient data collection and analysis.
User-adjustable force control mechanism and proprietary optical deflection
height-measurement sensor represent a major advance in state-of-the-art surface
profiling technology. The XP-2 has the lowest mass and inertia stylus assembly
to minimize tip/sample interaction with stylus loads as low as 0.05mg.
Motorized color zoom camera with standard 40-160X magnification and 1-4mm Field
of View (Optional 89-356X with 0.6-2.4mm FOV). Precision optics employed on the
XP-2 combine high magnification with large FOV.
Up to 60,000 data point per scan line (regardless of scan length) data
collection means that your lateral resolution is always tip limited.
Windows XP graphical user interface, TFT Flat Panel Monitor, and USB
communications protocol gives you simple sample navigation, image capture, data
analysis, printing and export. 3D Rendering software is also available as a
standard option.
Standard software features including Step Detection, Stress Measurement, Scan
Stitching, Auto Level, and Auto Measure make data acquisition and analysis
reliable and efficient. 3D Rendering software is available.
Software updates are free for the life of the instrument.
Related Documents:
XP-2 Product Brochure and Specifications (PDF)
XP-2 Software Highlights
Image Gallery
Purchase an XP-2
Company Details
Ambios Technology, Inc. was founded in 1996. The company is dedicated to the design and manufacture of innovative surface metrology instruments for the academic and general industrial sectors. With the number of installed instruments growing... more
| More Products of this Company: |
ACCESSORIES, OPTIONS, AND SUPPLIES, Next Generation XP-Plus Surface Profilometer Product Line, Q-Scope™ Series | Scanning Probe Microscope, Q-Scope™ Universal SPM | Scanning Probe Microscope, Xi-100 Non-Contact Optical Profiler | Scanning White Light Interferometer, XP-1 High Resolution Surface Profiler | Stylus-Type Profilometer |
| Related Products: |
ACCESSORIES, OPTIONS, AND SUPPLIES, Next Generation XP-Plus Surface Profilometer Product Line, Q-Scope™ Series | Scanning Probe Microscope, Q-Scope™ Universal SPM | Scanning Probe Microscope, Xi-100 Non-Contact Optical Profiler | Scanning White Light Interferometer, XP-1 High Resolution Surface Profiler | Stylus-Type Profilometer |
|
