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Date: 04 July 2008
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XP-1 High Resolution Surface Profiler | Stylus-Type Profilometer  
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XP-1 High Resolution Surface Profiler | Stylus-Type Profilometer

Product Name: XP-1 High Resolution Surface Profiler | Stylus-Type Profilometer

Product Description

The Ambios Technology XP-1 is the Price/Performance Leader in the stylus profiler market. Designed specifically for the budget-conscious researcher, the XP-1 Surface Profiler delivers the newest technology available at the lowest possible cost. Equipped with a 140mm manual sample stage and fixed 100X magnification optics, the XP-1 has an ultra-compact footprint of only 16 x 10 x 10 inches.

XP-1 Features Include:
Linear-scan stage technology and precision optical flat (flat to 6 Angstroms per millimeter) ensure the highest precision measurements. Step height repeatability is guaranteed to be 10Ĺ or 0.1% of nominal step, whichever is greater.
140mm diameter manual sample stage and 30mm maximum sample height accommodates many different sample sizes and shapes.
User-adjustable force control mechanism and proprietary optical deflection height-measurement sensor represent a major advance in state-of-the-art surface profiling technology. The XP-1 has the lowest mass and inertia stylus assembly to minimize tip/sample interaction with stylus loads as low as 0.05mg.

High resolution measurements are never compromised with the XP-1. Step height repeatability is guaranteed to be 10A or 0.1% of the nominal value, whichever is greater.
Fixed 100X magnification color camera (Motorized zoom optical assembly is available as an option).
Up to 60,000 data point per scan line (regardless of scan length) data collection means that your lateral resolution is always tip limited.
Windows XP graphical user interface, TFT Flat Panel Monitor, and USB communications protocol gives you simple sample navigation, image capture, data analysis, printing and export.
Software updates are free for the life of the instrument.

Related Documents:
XP-1 Product Brochure and Specifications (PDF)
XP-1 Software Highlights
Image Gallery
Purchase an XP-1


Company Details

Ambios Technology, Inc. was founded in 1996. The company is dedicated to the design and manufacture of innovative surface metrology instruments for the academic and general industrial sectors. With the number of installed instruments growing... more

More Products of this Company: ACCESSORIES, OPTIONS, AND SUPPLIES, Next Generation XP-Plus Surface Profilometer Product Line, Q-Scope™ Series | Scanning Probe Microscope, Q-Scope™ Universal SPM | Scanning Probe Microscope, Xi-100 Non-Contact Optical Profiler | Scanning White Light Interferometer, XP-2 High Resolution Surface Profiler | Stylus-Type Profilometer
Related Products: ACCESSORIES, OPTIONS, AND SUPPLIES, Next Generation XP-Plus Surface Profilometer Product Line, Q-Scope™ Series | Scanning Probe Microscope, Q-Scope™ Universal SPM | Scanning Probe Microscope, Xi-100 Non-Contact Optical Profiler | Scanning White Light Interferometer, XP-2 High Resolution Surface Profiler | Stylus-Type Profilometer
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