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Product Name: Q-Scope™ Universal SPM | Scanning Probe Microscope
Product Description
The USPM Model is a small sample scanning probe microscope that rasters the
sample rather than the probe. The tight mechanical loop of this instrument
allows the highest resolution data when imaging in either AFM or STM imaging
modes. It is equipped with a built-in 250X video microscope. An available
Acoustic/Vibration Isolation Chamber (AVIC) isolates at 1Hz vertically, and
0.8Hz horizontally and acoustically. The USPM can be purchased as a complete
stand-alone system, or added to an existing Q-Scope.
Q-Scope USPM Features Include:
250X video microscope with 90 degree top-down view for easy alignment and
positioning of the AFM probe. Tip and surface view is 45 degrees during STM
operation.
Easy-to-use controls permit rapid probe exchange and alignment, sample approach,
and intuitive display and adjustment of all SPM operating parameters. There is a
micrometer-driven X-Y translation of the scan head over the sample.
Virtually all AFM imaging modes, including WaveModeTM intermittent-contact mode,
which can capture topographic, lateral force, phase, magnetic and force-
distance curves are standard.
Patented Analoop™ analog PID feedback loop that is digitally controlled which
allows more accurate data gathering and has an extremely fast sampling
frequency.
Interchangeable scanning modules offer scan ranges from 500nm to 80um. The
Metrology option adds closed loop positioning sensors to all 3 axes. Accuracy is
within 0.2% in X and Y, and within 1.0% in Z.
User interfaces are implemented in a Windows XP graphical environment with
easy-to-use controls for fast laser intensity optimization, graphical display of
the SofTouch™ computer-controlled Z-axis approach to sample, and for setting of
all operating parameters (scan rate, scan size, resolution, zoom, scan rotation,
feedback signal, signal gain, etc.).
Scanning at rates as high as 20Hz are possible, greatly enhancing data
acquisition times. With Broadband Mode, the error signal generated by the shifts
in cantilever angle during scanning is used to correct the scan data collected
at high speed.
Options and Accessories available for our SPMs ranges from closed-loop metrology
scanners to Nanolithography software, or from combined SPM/Hysitron tribology
capabilities to liquid cells and cantilevers.
Related Documents:
USPM Brochure (PDF)
USPM Software Highlights
Image Gallery
Purchase a Q-scope USPM
Company Details
Ambios Technology, Inc. was founded in 1996. The company is dedicated to the design and manufacture of innovative surface metrology instruments for the academic and general industrial sectors. With the number of installed instruments growing... more
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ACCESSORIES, OPTIONS, AND SUPPLIES, Next Generation XP-Plus Surface Profilometer Product Line, Q-Scope™ Series | Scanning Probe Microscope, Xi-100 Non-Contact Optical Profiler | Scanning White Light Interferometer, XP-1 High Resolution Surface Profiler | Stylus-Type Profilometer, XP-2 High Resolution Surface Profiler | Stylus-Type Profilometer |
| Related Products: |
ACCESSORIES, OPTIONS, AND SUPPLIES, Q-Scope™ Series | Scanning Probe Microscope, Xi-100 Non-Contact Optical Profiler | Scanning White Light Interferometer |
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