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Product Name: Q-Scope™ Series | Scanning Probe Microscope
Product Description
Designed to deliver an SPM platform which can grow and adapt to changing
research needs, the Ambios Q-ScopeTM delivers long-term value as well as
excellent imaging performance and high resolution measurements. Our modular
approach to building your system minimizes cost, offers maximum flexibility, and
allows custom configurations for special applications. Electronic control signal
levels are available to all users via back-panel BNC access.
Q-Scope U-SPM Features Include:
Patented Isotopic Focal System™ permits 90 degree top-down view for easy
alignment and positioning of the probe as well as tracking of cantilever/probe
during scanning for increased sensitivity and elimination of laser light
reflections from the sample.
Patented Analoop™ analog PID feedback loop that is digitally controlled which
has no digital quantizing errors and an extremely fast sampling frequency.
Interchangeable Q-Scan™ AFM scanning assemblies offer scan ranges from 20um to
200um in X and Y and up to 17 um in Z. Dual tube scanners eliminate crosstalk
between X, Y, and Z axes and are inherently more linear.
The Metrology option adds closed loop positioning sensors to all 3 axes.
Accuracy is within 0.2% in X and Y, and within 1.0% in Z.
User interfaces are implemented in a Windows XP graphical environment with
easy-to-use controls for fast laser intensity optimization, graphical display of
the SofTouch™ approach to sample, and for setting of all operating parameters
(scan rate, scan size, resolution, zoom, scan rotation, feedback signal, signal
gain, etc.).
Scanning at rates as high as 20Hz are possible, greatly reducing data
acquisition times. With Broadband Mode, the error signal generated by the shifts
in cantilever angle during scanning is used to correct the scan data collected
at high speed.
Q-Lithic™ stage features solid granite base and support arch for excellent
mechanical and thermal stability. Additional damping of environmental noise is
achieved with the optional Acoustic/Vibration Isolation Chamber.
Options and Accessories available for our SPMs ranges from closed-loop metrology
scanners to Nanolithography software, or from combined SPM/Hysitron tribology
capabilities to liquid cells and cantilevers.
With the Q-Scope™, easy-to-use controls permit rapid probe exchange and
alignment, sample approach, and intuitive display and adjustment of all SPM
operating parameters. Manual or motorized X-Y and R, Theta sample translation
stages are available with automated scanning and storage of data from multiple
areas on the sample (e.g. on patterned wafers).
Virtually all AFM imaging modes, including WaveMode™ intermittent-contact mode,
which can capture topographic, lateral force, phase, magnetic and force-distance
curves are standard.
Related Documents:
Q-scope Brochure (PDF)
Q-scope Software Highlights
Image Gallery
Purchase a Q-scope
Company Details
Ambios Technology, Inc. was founded in 1996. The company is dedicated to the design and manufacture of innovative surface metrology instruments for the academic and general industrial sectors. With the number of installed instruments growing... more
| More Products of this Company: |
ACCESSORIES, OPTIONS, AND SUPPLIES, Next Generation XP-Plus Surface Profilometer Product Line, Q-Scope™ Universal SPM | Scanning Probe Microscope, Xi-100 Non-Contact Optical Profiler | Scanning White Light Interferometer, XP-1 High Resolution Surface Profiler | Stylus-Type Profilometer, XP-2 High Resolution Surface Profiler | Stylus-Type Profilometer |
| Related Products: |
ACCESSORIES, OPTIONS, AND SUPPLIES, Next Generation XP-Plus Surface Profilometer Product Line, Q-Scope™ Universal SPM | Scanning Probe Microscope, Xi-100 Non-Contact Optical Profiler | Scanning White Light Interferometer |
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