Electron source for SEM and Auger experiments with spot size better than 20 nm at 25 kV beam voltage/0.5 nA beam current, at 25 mm working distance. 1 - 25 keV thermal field emission electron source (Schottky emitter), maximum beam current >100 nA. Electrostatic focusing column with double lens system, beam alignment quadrupoles, beam blanking plates, and octopole for deflection and stigmation. Beam current is continuously adjustable by an electron-optically variable aperture. Internal beam current measurement facility by blanking onto a Faraday cup aperture connected to a B feedthrough. Pneumatically operated column isolation valve. Required source area vacuum <1d10-8 mbar. Pumping port NW 35 CF (2 ¾" OD) at the side of the source chamber. Bakeable to 180 °C. Mounting flange NW 63 CF (4 ½" OD).
Company Details
1984
Omicron starts it's business with the presentation of the revolutionary reverse view LEED principle.
1987
Omicron develops the legendary STM 1, the companies first Scanning Tunneling Microscope
1989
Foundation of an Omicron subsidiary... more
