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Date: 23 November 2008
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Electron Sources SEM 250  
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Electron Sources SEM 250
United States
United States

Product Name: Electron Sources SEM 250

Product Description

Electron source for SEM and Auger experiments with spot size better than 250 nm at 12 kV beam voltage/1 nA beam current, at 16 mm working distance. Featuring 0.2 - 12 keV beam energy, Tungsten-filament, maximum beam current 1 µA, the SEG 250 is a versatile, fully electrostatic focusing and deflection column, with variable beam current. Bakeable to 200 °C. Mounting flange NW 63 CF (4½" OD).

Company Details

1984 Omicron starts it's business with the presentation of the revolutionary reverse view LEED principle. 1987 Omicron develops the legendary STM 1, the companies first Scanning Tunneling Microscope 1989 Foundation of an Omicron subsidiary... more

More Products of this Company: Electron Sources, Electron Sources EKF 1000, Electron Sources ISE 10, Electron Sources RHEED 20, Electron Sources RHEED 30, Electron Sources SEM 20, Electron Sources SEM 500, Electron Sources SL 1000 SPA, Ion Sources ISE 100/200, Ion Sources ISE 5, Photon Sources DAR 400, Photon Sources HIS 13, Photon Sources XM 1000
Related Products: Electron Sources, Electron Sources EKF 1000, Electron Sources ISE 10, Electron Sources RHEED 20, Electron Sources RHEED 30, Electron Sources SEM 20, Electron Sources SEM 500, Electron Sources SL 1000 SPA, Ion Sources ISE 100/200, Ion Sources ISE 5, Photon Sources DAR 400, Photon Sources HIS 13, Photon Sources XM 1000
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