Everything Engineering
Login:   Password:
Not Register?    Sign Up NOW!
Date: 16 October 2008
Google
 
PEEM Imaging FOCUS IS-PEEM  
Search Country   Reset filter

PEEM Imaging FOCUS IS-PEEM

Product Name: PEEM Imaging FOCUS IS-PEEM

Product Description

PEEM Imaging FOCUS IS-PEEM
• < 20 nm resolution achieved
• Integral sample stage
• Contrast Aperture (option)
• Stigmator/Deflector
• Iris Aperture (option)

Photoemission Electron Microscope with integral sample stage for unsurpassed stability and precise sample positioning via remote controlled piezo drives.

Power supply unit

The in-situ variable contrast aperture and the stigmator/deflector allow the power of PEEM to be fully exploited in laboratory and synchrotron applications. Topography contrast, work function contrast, chemical contrast and magnetic contrast can be used for surface sensitive real-time imaging of any reasonably flat and conducting surface.

Company Details

1984 Omicron starts it's business with the presentation of the revolutionary reverse view LEED principle. 1987 Omicron develops the legendary STM 1, the companies first Scanning Tunneling Microscope 1989 Foundation of an Omicron subsidiary... more

More Products of this Company: PEEM Imaging, PEEM Imaging & Spectroscopy FOCUS PEEM with Imaging Energy Filter, PEEM Imaging & Spectroscopy FOCUS PEEM with MICROANALYSER, PEEM Imaging & Spectroscopy FOCUS TOF PEEM
Related Products: 4 Point Probe in UHV UHV NANOPROBE System, Combined SPM/SEM/SAM MULTISCAN LAB, E-Beam Evaporators EFM 3i, Electron Spectrometers AR 65, Electron Spectrometers CSA 300 & SPLEED, Electron Spectrometers EA 125, Electron Spectrometers EA 125 HR, Electron Spectrometers ELS 5000 HREELS, Electron Spectrometers SHA 50 & SPLEED, Electron Spectrometers SPHERA, ESCA+, ESCAPROBE, Large Samples Large Sample Beam Defl. AFM, Large Samples Large Sample SPM, Low Temperature Instruments Cryogenic SFM, Low Temperature Instruments Cryogenic STM, Low Temperature Instruments LT STM, Multi-Technique SPMs Multiscan STM, Multi-Technique SPMs UHV NANOPROBE, NanoESCA, NanoSAM Auger Analyser, NanoSAM Lab, PEEM Imaging, PEEM Imaging & Spectroscopy FOCUS PEEM with Imaging Energy Filter, PEEM Imaging & Spectroscopy FOCUS PEEM with MICROANALYSER
Home | Members.Benefit | Privacy.Policy | Bookmark.This.Page | Contact.Us
© 2006 - 2007 4engr. All Rights reserved |Recommended Engineering Sites:| Center for Respect of Life and Environment | Internet Dictionary|Enginering intent(Engineering Events) | Map Archive