The FOCUS PEEM is a real-time Photoemission Electron Microscope for surface
sensitive imaging. PEEM can image any flat conducting surface using laboratory
light sources (high pressure mercury lamp, deuterium lamp) or synchrotron
radiation. In contrast to the FOCUS IS-PEEM, the FOCUS PEEM is not equipped with
an integral sample stage, and thus allows imaging of samples on a separate
sample manipulator.
Company Details
1984
Omicron starts it's business with the presentation of the revolutionary reverse view LEED principle.
1987
Omicron develops the legendary STM 1, the companies first Scanning Tunneling Microscope
1989
Foundation of an Omicron subsidiary... more
