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Product Name: Parametric Test
Product Description
Integrated circuit devices continue to shrink in size, increase
in density, and improve in performance every year. Manufacturing and testing
these devices while simultaneously maintaining and improving yield has become
increasingly difficult. Nevertheless, Agilent Technologies' parametric test
solutions continue to meet these challenges and to provide users with
consistently accurate and highly automated test solutions for better process
monitoring. Our award winning parametric test systems are a de facto industry
standard, with over 2,900 systems installed worldwide. With a history of over 60
years of innovation and leadership in the Test and Measurement industry, Agilent
knows what it takes to meet the stringent demands of parametric test customers.
Products & Services
- 4070
Series
Provides a broad range of system configurations to meet your production
parametric testing needs.
- 41000
Series
The Agilent 41000 Series is a highly accurate CV-IV parametric measurement
solution for the characterization of wafers in low-volume R&D,
laboratory and process development environments.
- Semiconductor
Parameter/Device Analyzer Series
A family of semiconductor device characterization instruments that use
different methodologies to meet the needs of today's diverse users.
- Modular
Source Monitor Unit Series
A flexible family of products, with solutions for both precise parametric
measurement of semiconductor devices and high speed testing of components
- Low
Leakage Switch Mainframe Family
Low-leakage switch mainframe solutions, positioned between the
semiconductor parameter analyzer and the wafer, reduce cost of test
through characterization test automation.
- Reliability
Test
The ASUR (Advanced Scalable Unified Reliability) product family provides a
range of semiconductor reliability test structures, measurement and
analysis.
- I/CV
3.0 Automation Software
Provides interactive and automated control of parametric instruments in a
PC-based environment.
- Parametric
Test System Services
Service and support solutions are essential components in any
semiconductor test operation. Explore a full suite of offerings available
on Parametric Test Systems.
- Parametric
Test Instrument Services
Successful manufacturers understand that services and support are
essential components in any parametric test operation.
- Discontinued
Parametric Test Equipment
4140B, 4142B, 4145A/B, 4155A, 4156A, 41501A, 4155B, 4156B, 4157A, 4280A,
E5270A, E5272A, and E5273A
Company Details
Agilent Technologies, a spin-off of Hewlett-Packard Company, broke records on
Nov. 18, 1999 as the largest initial public offering (IPO) in Silicon Valley
history. The US $2.1 billion raised from that IPO was a sharp contrast to the
$538 in... more
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